Signals induced by charge-trapping in EDELWEISS FID detectors: Analytical modeling and applications

Arnaud, Q., Armengaud, E., Augier, C. et al. (46 more authors) (2016) Signals induced by charge-trapping in EDELWEISS FID detectors: Analytical modeling and applications. Journal of Instrumentation, 11 (10).

Abstract

Metadata

Authors/Creators:
  • Arnaud, Q.
  • Armengaud, E.
  • Augier, C.
  • Benoît, A.
  • Bergé, L.
  • Billard, J.
  • Blümer, J.
  • De Boissière, T.
  • Broniatowski, A.
  • Camus, P.
  • Cazes, A.
  • Chapellier, M.
  • Charlieux, F.
  • Dumoulin, L.
  • Eitel, K.
  • Foerster, N.
  • Fourches, N.
  • Gascon, J.
  • Giuliani, A.
  • Gros, M.
  • Hehn, L.
  • Heuermann, G.
  • Jésus, M.D.
  • Jin, Y.
  • Juillard, A.
  • Kleifges, M.
  • Kozlov, V.
  • Kraus, H.
  • Kéfélian, C.
  • Kudryavtsev, V.A.
  • Le-Sueur, H.
  • Marnieros, S.
  • Navick, X.F.
  • Nones, C.
  • Olivieri, E.
  • Pari, P.
  • Paul, B.
  • Piro, M.C.
  • Poda, D.
  • Queguiner, E.
  • Rozov, S.
  • Sanglard, V.
  • Schmidt, B.
  • Scorza, S.
  • Siebenborn, B.
  • Tcherniakhovski, D.
  • Vagneron, L.
  • Weber, M.
  • Yakushev, E.
Copyright, Publisher and Additional Information: © 2016 IOP Publishing. This is an author produced version of a paper subsequently published in Journal of Instrumentation. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: FID; induced signals; Shockley-Ramo; charge-carrier trapping; analytical model; dark matter detectors
Dates:
  • Published: 11 October 2016
  • Published (online): 11 October 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Funding Information:
FunderGrant number
SCIENCE AND TECHNOLOGY FACILITIES COUNCILST/K006444/1
Depositing User: Symplectic Sheffield
Date Deposited: 07 Nov 2016 16:29
Last Modified: 11 Oct 2017 01:59
Published Version: http://doi.org/10.1088/1748-0221/11/10/P10008
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1748-0221/11/10/P10008

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