A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

Mullin, N. and Hobbs, J.K. (2014) A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy. Review of Scientific Instruments, 85 (11). 113703. ISSN 0034-6748

Abstract

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Authors/Creators:
  • Mullin, N.
  • Hobbs, J.K.
Copyright, Publisher and Additional Information: © 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License (https://creativecommons.org/licenses/by/3.0/).
Dates:
  • Published: November 2014
  • Published (online): 19 November 2014
  • Accepted: 27 October 2014
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 27 Oct 2016 15:29
Last Modified: 27 Oct 2016 15:29
Published Version: https://dx.doi.org/10.1063/1.4901221
Status: Published
Publisher: AIP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1063/1.4901221

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