Atomic-level structural and chemical analysis of Cr-doped Bi2Se3 thin films

Ghasemi, A, Kepaptsoglou, D, Collins-McIntyre, L J et al. (3 more authors) (2016) Atomic-level structural and chemical analysis of Cr-doped Bi2Se3 thin films. Scientific Reports. 26549. ISSN 2045-2322

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Dates:
  • Published: 25 May 2016
  • Accepted: 4 May 2016
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: Pure (York)
Date Deposited: 25 Jul 2016 11:17
Last Modified: 17 Nov 2019 17:10
Published Version: https://doi.org/10.1038/srep26549
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1038/srep26549

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