Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

Zhou, Y., Fox, D.S., Maguire, P. et al. (7 more authors) (2016) Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. SCIENTIFIC REPORTS, 6. ARTN 21045. ISSN 2045-2322

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Copyright, Publisher and Additional Information: This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
Dates:
  • Published: 16 February 2016
  • Accepted: 25 November 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ROYAL SOCIETYIE140211
LEVERHULME TRUST (THE)VP1-2014-011
Depositing User: Symplectic Sheffield
Date Deposited: 14 Jul 2016 13:25
Last Modified: 14 Jul 2016 13:25
Published Version: http://dx.doi.org/10.1038/srep21045
Status: Published
Publisher: Nature Publishing Group
Refereed: Yes
Identification Number: https://doi.org/10.1038/srep21045
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