Analysis and design of a differential sampled-line six-port reflectometer

Julrat, S, Chongcheawchamnan, M, Khaoraphapong, T et al. (1 more author) (2012) Analysis and design of a differential sampled-line six-port reflectometer. IEEE Transactions on Microwave Theory and Techniques, 61 (1). 244 - 255. ISSN 0018-9480



  • Julrat, S
  • Chongcheawchamnan, M
  • Khaoraphapong, T
  • Robertson, ID
Copyright, Publisher and Additional Information: (c) 2012 IEEE. This is an author produced version of a paper published in IEEE Transactions on Microwave Theory and Techniques. Uploaded in accordance with the publisher's self-archiving policy. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works
Keywords: Impedance measurement; microwave measurements; reflectometry; transmission line measurements; UHF detectors; baluns; coplanar waveguides; electric impedance measurement; interference (signal); network analysers; reflectometers; strip lines; CPS; DUT; RF logarithmic detector; SPR; commercial automatic vector network analyzer; common-mode interference signal; common-mode rejection ratio analysis; coplanar strip transmission line form; device under test; differential sampled-line six-port reflectometer; frequency 1 GHz; impedance measurement; load impedance measurement; calibration; Impedance; Impedance matching; Radio frequency; Scattering parameters; Transmission line measurements
  • Published: 27 December 2012
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 26 Jan 2015 15:49
Last Modified: 17 Jan 2018 09:27
Published Version:
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
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