Low-voltage SEM of air-sensitive powders: from sample preparation to micro/nano analysis with secondary electron hyperspectral imaging

Nohl, J.F., Farr, N.T.H. orcid.org/0000-0001-6761-3600, Sun, Y. et al. (3 more authors) (2022) Low-voltage SEM of air-sensitive powders: from sample preparation to micro/nano analysis with secondary electron hyperspectral imaging. Micron, 156. 103234. ISSN 0968-4328

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2022 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
Keywords: Low-voltage scanning electron microscopy (LV-SEM); Secondary electron hyperspectral imaging (SEHI); Powder characterization; Energy storage materials; Additive manufacturing (AM) materials
Dates:
  • Accepted: 2 March 2022
  • Published (online): 14 March 2022
  • Published: May 2022
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCILEP/N008065/1
Engineering and Physical Sciences Research CouncilEP/R00661X/1
Engineering and Physical Sciences Research CouncilEP/N001982/2
Engineering and Physical Sciences Research CouncilEP/V012126/1
Depositing User: Symplectic Sheffield
Date Deposited: 06 May 2022 10:22
Last Modified: 06 May 2022 10:22
Status: Published
Publisher: Elsevier BV
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.micron.2022.103234
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