Development of a new machine learning-based informatics system for product health monitoring

Papananias, M. orcid.org/0000-0001-7121-9681, Obajemu, O., McLeay, T.E. et al. (2 more authors) (2020) Development of a new machine learning-based informatics system for product health monitoring. In: Gao, R.X. and Ehmann, K., (eds.) Procedia CIRP. 53rd CIRP Conference on Manufacturing Systems, 01-03 Jul 2020, Chicago, IL, U.S.. Elsevier , pp. 473-478.

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2020 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Keywords: Manufacturing Informatics; Multistage Manufacturing Process; Principal Componet Analysis; Artificial Neural Networks; Multiple linear Regression
Dates:
  • Published (online): 22 September 2020
  • Published: 22 September 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Automatic Control and Systems Engineering (Sheffield)
Funding Information:
FunderGrant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCILEP/P006930/1
Depositing User: Symplectic Sheffield
Date Deposited: 20 Oct 2020 10:22
Last Modified: 20 Oct 2020 20:37
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.procir.2020.03.075

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