Petzold, Stefan, Zintler, Alexander, Eilhardt, Robert et al. (8 more authors) (2019) Forming-Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices. Advanced Electronic Materials. 1900484.
Abstract
A model device based on an epitaxial stack combination of titanium nitride (111) and monoclinic hafnia (11 (Formula presented.)) is grown onto a c-cut Al 2O 3-substrate to target the role of grain boundaries in resistive switching. The texture transfer results in 120° in-plane rotated m-HfO 2 grains, and thus, in a defined subset of allowed grain boundary orientations of high symmetry. These engineered grain boundaries thread the whole dielectric layer, thereby providing predefined breakdown paths for electroforming-free resistive random access memory devices. Combining X-ray diffraction and scanning transmission electron microscopy (STEM)–based localized automated crystal orientation mapping (ACOM), a nanoscale picture of crystal growth and grain boundary orientation is obtained. High-resolution STEM reveals low-energy grain boundaries with facing ((Formula presented.)) and ((Formula presented.) 21) surfaces. The uniform distribution of forming voltages below 2 V—within the operation regime—and the stable switching voltages indicates reduced intra- and device-to-device variation in grain boundary engineered hafnium-oxide-based random access memory devices.
Metadata
Item Type: | Article | ||||
---|---|---|---|---|---|
Authors/Creators: |
|
||||
Copyright, Publisher and Additional Information: | © Authors, 2019 | ||||
Keywords: | grain boundary engineering, hafnium oxide, resistive switching memory, texture transfer, transmission electron microscopy | ||||
Dates: |
|
||||
Institution: | The University of York | ||||
Academic Units: | The University of York > Faculty of Sciences (York) > Physics (York) | ||||
Funding Information: |
|
||||
Depositing User: | Pure (York) | ||||
Date Deposited: | 31 Jul 2019 11:50 | ||||
Last Modified: | 28 Mar 2024 00:14 | ||||
Published Version: | https://doi.org/10.1002/aelm.201900484 | ||||
Status: | Published online | ||||
Refereed: | Yes | ||||
Identification Number: | https://doi.org/10.1002/aelm.201900484 | ||||
Related URLs: |
Download
Filename: Petzold_et_al_2019_Advanced_Electronic_Materials.pdf
Description: Petzold_et_al-2019-Advanced_Electronic_Materials
Licence: CC-BY 2.5