Preface of 19 th Microscopy of Semiconducting Materials conference

Metadata

Authors/Creators:	Walther, T. https://orcid.org/0000-0003-3571-6263 Beanland, R.
Copyright, Publisher and Additional Information:	© 2016 Wiley. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Dates:	Accepted: 28 January 2016 Published (online): 14 April 2016 Published: May 2016
Institution:	The University of Sheffield
Academic Units:	The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User:	Symplectic Sheffield
Date Deposited:	16 Nov 2016 14:08
Last Modified:	14 Apr 2017 02:19
Published Version:	http://dx.doi.org/10.1111/jmi.12391
Status:	Published
Publisher:	Wiley
Refereed:	Yes
Identification Number:	https://doi.org/10.1111/jmi.12391

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