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Yee, M., Ng, W.K., David, J.P.R. et al. (3 more authors) (2003) Temperature dependence of breakdown and avalanche multiplication in In0.53Ga0.47As diodes and heterojunction bipolar transistors. IEEE Transactions on Electron Devices, 50 (10). pp. 2021-2026. ISSN 0018-9383

This list was generated on Sun Oct 13 04:35:36 2019 BST.