Items where authors include "Winkelmann, A."

Article

Trimby, P., Al-Mosawi, M., Al-Jawad, M. et al. (4 more authors) (2024) The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching. Ultramicroscopy, 260. 113940. ISSN 0304-3991

Trager-Cowan, C., Alasmari, A., Avis, W. et al. (34 more authors) (2020) Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope. Semiconductor Science and Technology, 35 (5). 054001. ISSN 0268-1242

Bruckbauer, J., Trager-Cowan, C., Hourahine, B. et al. (15 more authors) (2020) Luminescence behavior of semipolar (101¯1) InGaN/GaN “bow-tie” structures on patterned Si substrates. Journal of Applied Physics, 127 (3). ISSN 0021-8979

Trager-Cowan, C., Alasmari, A., Avis, W. et al. (33 more authors) (2019) Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82.

Naresh-Kumar, G., Bruckbauer, J., Winkelmann, A. et al. (6 more authors) (2019) Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope. Nano Letters, 19 (6). pp. 3863-3870. ISSN 1530-6984

Proceedings Paper

Trager-Cowan, C., Alasmari, A., Avis, W. et al. (34 more authors) (2020) Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope. In: IOP Conference Series: Materials Science and Engineering. 16th European Workshop on Modern Developments and Applications in Microbeam Analysis, 19-23 May 2019, Trondheim, Norway. IOP Publishing .