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Proceedings Paper

Sharp, J., Muller, I.C., Mandal, P. et al. (5 more authors) (2015) Cross sectional TEM analysis of duplex HIPIMS and DC magnetron sputtered Mo and W doped carbon coatings. In: Journal of Physics: Conference Series. Electron Microscopy and Analysis Group Conference (EMAG2015), 29 June to 2 July 2015, Manchester, UK. IOP .

This list was generated on Sun Oct 20 04:47:32 2019 BST.