Items where authors include "Walker, Chris"

Article

Suri, Ashish, Pratt, Andrew orcid.org/0000-0002-0795-2640, Tear, Steve orcid.org/0000-0002-1535-1327 et al. (2 more authors) (2020) Next generation secondary electron detector with energy analysis capability for SEM. Journal of Microscopy. ISSN 1365-2818