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Califano, M., Vinh, N.Q., Phillips, P.J. et al. (10 more authors) (2007) Interwell relaxation times in p-Si/SiGe asymmetric quantum well structures: the role of interface roughness. Physical Review B, 75 (4). Art. No. 045338. ISSN 1550-235x

This list was generated on Sun May 24 17:27:42 2020 BST.