Items where authors include "Saito, W."
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Luo, P, Madathil, S orcid.org/0000-0001-6832-1300, Saito, W. et al. (1 more author) (2022) Investigation of turn-on performance in 1.2 kV MOS-bipolar devices. Japanese Journal of Applied Physics, 61 (SC). SC0801. ISSN 0021-4922
Luo, P., Madathil, S. orcid.org/0000-0001-6832-1300, Nishizawa, S.-I. et al. (1 more author) (2021) Turn-off dV/dt controllability in 1.2kV MOS-bipolar devices. IEEE Transactions on Power Electronics, 36 (3). pp. 3304-3311. ISSN 0885-8993
Luo, P., Madathil, S. orcid.org/0000-0001-6832-1300, Nishizawa, S. et al. (1 more author) (2020) Evaluation of dynamic avalanche performance in 1.2kV MOS-bipolar devices. IEEE Transactions on Electron Devices, 67 (9). pp. 3691-3697. ISSN 0018-9383
Proceedings Paper
Luo, P., Madathil, S.N.E. orcid.org/0000-0001-6832-1300, Nishizawa, S.-I. et al. (1 more author) (2020) Dynamic avalanche free super junction-TCIGBT for high power density operation. In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD). 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), 13-18 Sep 2020, Vienne, Austria (online). IEEE . ISBN 9781728148373
Luo, P., Madathil, S.N.E. orcid.org/0000-0001-6832-1300, Nishizawa, S.-I. et al. (1 more author) (2020) High dV/dt controllability of 1.2kV Si-TCIGBT for high flexibility design with ultra-low loss operation. In: Proceedings of 2020 IEEE Applied Power Electronics Conference and Exposition (APEC). 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), 15-19 Mar 2020, New Orleans, LA, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 686-689. ISBN 9781728148304
Luo, P., Ekkanath Madathil, S.N., Nishizawa, S. et al. (1 more author) (2020) Dynamic avalanche free design in 1.2kV Si-IGBTs for ultra high current density operation. In: Proceedings of 2019 IEEE International Electron Devices Meeting (IEDM). 65th IEEE International Electron Devices Meeting (IEDM), 07-11 Dec 2019, San Francisco, CA, USA. Institute of Electrical and Electronics Engineers (IEEE) , 12.3.1-12.3.4. ISBN 9781728140339