Items where authors include "Ruterana, P."

Article

Deng, Y. orcid.org/0000-0002-8804-9428, Xie, N., Hu, W. orcid.org/0000-0003-0254-8363 et al. (17 more authors) (2023) Atomic plane misorientation assisted crystalline quality improvement in epitaxial growth of AlN on a nanopatterned sapphire (0001) surface for deep ultraviolet photoelectric devices. ACS Applied Nano Materials, 6 (6). pp. 4262-4270. ISSN 2574-0970

Wang, X., Chauvat, M.P., Ruterana, P. et al. (1 more author) (2017) Effective absorption correction for energy dispersive X-ray mapping in a scanning transmission electron microscope: analyzing the local indium distribution in rough samples of InGaN alloy layers. Journal of Microscopy, 268 (3). pp. 248-253. ISSN 0022-2720

Walther, T. orcid.org/0000-0003-3571-6263, Wang, X., Angadi, V.C. orcid.org/0000-0002-0538-4483 et al. (3 more authors) (2016) Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope. Journal of Materials Research. ISSN 0884-2914

Wang, X., Chauvat, M.P., Ruterana, P. et al. (1 more author) (2016) Investigation of phase separation in InGaN alloys by plasmon loss spectroscopy in TEM. MRS Advances, 1 (40). pp. 2749-2756. ISSN 2059-8521

Wang, X., Chauvat, M.P., Ruterana, P. et al. (1 more author) (2015) Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures. Semiconductor Science and Technology, 30 (11). 114011. ISSN 0268-1242