Items where authors include "Puech, William"

Proceedings Paper

Li, Zhenyu, Beugnon, Sebastien, Puech, William et al. (1 more author) (2017) Rethinking the High Capacity 3D Steganography : Increasing its Resistance to Steganalysis. In: IEEE International Conference on Image Processing (ICIP). UNSPECIFIED. IEEE , pp. 510-514.