Items where authors include "Papananias, M."

Article

Papananias, M. orcid.org/0000-0001-7121-9681, McLeay, T.E. orcid.org/0000-0002-7509-0771, Mahfouf, M. orcid.org/0000-0002-7349-5396 et al. (1 more author) (2023) A probabilistic framework for product health monitoring in multistage manufacturing using Unsupervised Artificial Neural Networks and Gaussian Processes. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, 237 (9). pp. 1295-1310. ISSN 0954-4054

Papananias, M., McLeay, T.E., Mahfouf, M. orcid.org/0000-0002-7349-5396 et al. (1 more author) (2022) A Bayesian information fusion approach for end product quality estimation using machine learning and on-machine probing. Journal of Manufacturing Processes, 76. pp. 475-485. ISSN 1526-6125

Obajemu, O., Mahfouf, M. orcid.org/0000-0002-7349-5396, Papananias, M. et al. (2 more authors) (2021) An interpretable machine learning based approach for process to areal surface metrology informatics. Surface Topography: Metrology and Properties, 9 (4). 044001. ISSN 2051-672X

Papananias, M. orcid.org/0000-0001-7121-9681, McLeay, T.E., Obajemu, O. et al. (2 more authors) (2020) Inspection by exception: a new machine learning-based approach for multistage manufacturing. Applied Soft Computing, 97 (Part A). 106787. ISSN 1568-4946

Papananias, M. orcid.org/0000-0001-7121-9681, McLeay, T.E., Mahfouf, M. et al. (1 more author) (2019) An Intelligent Metrology Informatics System based on Neural Networks for Multistage Manufacturing Processes. Procedia CIRP, 82. pp. 444-449. ISSN 2212-8271

Papananias, M., McLeay, T.E., Mahfouf, M. orcid.org/0000-0002-7349-5396 et al. (1 more author) (2019) A Bayesian framework to estimate part quality and associated uncertainties in multistage manufacturing. Computers in Industry, 105. pp. 35-47. ISSN 0166-3615

Proceedings Paper

Papananias, M. orcid.org/0000-0001-7121-9681, Obajemu, O., McLeay, T.E. et al. (2 more authors) (2020) Development of a new machine learning-based informatics system for product health monitoring. In: Gao, R.X. and Ehmann, K., (eds.) Procedia CIRP. 53rd CIRP Conference on Manufacturing Systems, 01-03 Jul 2020, Chicago, IL, U.S.. Elsevier , pp. 473-478.

Papananias, M. orcid.org/0000-0001-7121-9681, McLeay, T., Mahfouf, M. et al. (1 more author) (2019) An intelligent metrology informatics system based on neural networks for multistage manufacturing processes. In: Procedia CIRP. 17th CIRP Conference on Modelling of Machining Operations, 13-14 Jun 2019, Sheffield, UK. Elsevier , pp. 444-449.