Items where authors include "Padilha, A. C. M."

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Padilha, A. C. M. and McKenna, K. P. orcid.org/0000-0003-0975-3626 (2018) Structure and properties of a model conductive filament/host oxide interface in HfO2-based ReRAM. PHYSICAL REVIEW MATERIALS. 45001. ISSN 2475-9953

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