Items where authors include "O'Neill, A.G."

Export as [feed] Atom [feed] RSS
Number of items: 1.

Proceedings Paper

Inkson, B.J. orcid.org/0000-0002-2631-9090, Olsen, S., Norris, D.J. et al. (2 more authors) (2003) 3D determination of a MOSFET gate morphology by FIB tomography. In: Cullis, A.G. and Midgley, P.A., (eds.) Microscopy of Semiconducting Materials 2003. Institute of Physics Conference 2003, 31 Mar - 03 Apr 2003, Cambridge, UK. CRC Press , pp. 611-616. ISBN 9781351074636

This list was generated on Sun Mar 24 11:14:20 2024 GMT.