Items where authors include "McKenna, Keith P"

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Number of items: 8.

Article

Armstrong, Alexander John, McKenna, Keith P orcid.org/0000-0003-0975-3626 and Wang, Yue orcid.org/0000-0002-2482-005X (2023) Directional dependence of band gap modulation via uniaxial strain in MoS2 and TiS3. Nanotechnology. ISSN 0957-4484

Quirk, James A, Miao, Bin, Feng, Bin et al. (4 more authors) (2021) Unveiling the Electronic Structure of Grain Boundaries in Anatase with Electron Microscopy and First-Principles Modeling. Nano Letters. pp. 9217-9223. ISSN 1530-6984

Schusteritsch, Georg, Ishikawa, Ryo, Elmaslmane, Abdul Razak et al. (4 more authors) (2021) Anataselike Grain Boundary Structure in Rutile Titanium Dioxide. Nano Letters. pp. 2745-2751. ISSN 1530-6984

Tong, Chuan-Jia, Edwards, Holly J, Hobson, Theodore D C et al. (4 more authors) (2020) Density Functional Theory and Experimental Determination of Band Gaps and Lattice Parameters in Kesterite Cu2ZnSn(SxSe1-x)4. JOURNAL OF PHYSICAL CHEMISTRY LETTERS. pp. 10463-10468. ISSN 1948-7185

Williams, Rhys, Ramasse, Quentin M, McKenna, Keith P orcid.org/0000-0003-0975-3626 et al. (6 more authors) (2020) Evidence for self-healing benign grain boundaries and a highly defective Sb2Se3-CdS interfacial layer in Sb2Se3 thin-film photovoltaics. ACS applied materials & interfaces. ISSN 1944-8252

Bean, Jonathan J, Saito, Mitsuhiro, Fukami, Shunsuke et al. (5 more authors) (2017) Atomic structure and electronic properties of MgO grain boundaries in tunnelling magnetoresistive devices. Scientific Reports. 45594. ISSN 2045-2322

Jiménez, Juan M, Bourret, Gilles R, Berger, Thomas et al. (1 more author) (2016) Modification of Charge Trapping at Particle/Particle Interfaces by Electrochemical Hydrogen Doping of Nanocrystalline TiO2. Journal of the American Chemical Society. pp. 15956-15964. ISSN 1520-5126

Wallace, Suzanne K and McKenna, Keith P orcid.org/0000-0003-0975-3626 (2014) Grain Boundary Controlled Electron Mobility in Polycrystalline Titanium Dioxide. Advanced materials interfaces. 1400078. ISSN 2196-7350

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