Items where authors include "Doclo, S."
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Cauchi, B., Siedenburg, K., Santos, J.F. et al. (3 more authors) (2019) Non-intrusive speech quality prediction using modulation energies and LSTM-network. IEEE/ACM Transactions on Audio, Speech, and Language Processing, 27 (7). pp. 1151-1163. ISSN 2329-9290
Kodrasi, I., Cauchi, B., Goetze, S. orcid.org/0000-0003-1044-7343 et al. (1 more author) (2017) Instrumental and perceptual evaluation of dereverberation techniques based on robust acoustic multichannel equalization. Journal of the Audio Engineering Society, 65 (1/2). pp. 117-129. ISSN 1549-4950
Proceedings Paper
Shishkin, S., Hollosi, D., Goetze, S. orcid.org/0000-0003-1044-7343 et al. (1 more author) (2024) Active learning for sound event classification using Bayesian neural networks with Gaussian variational posterior. In: ICASSP 2024 - 2024 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP). IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP24), 14-19 Apr 2024, Seoul, South Korea. Institute of Electrical and Electronics Engineers (IEEE) , pp. 896-900. ISBN 979-8-3503-4486-8
Shishkin, S., Hollosi, D., Doclo, S. et al. (1 more author) (2021) Active learning for sound event classification using Monte-Carlo dropout and PANN embeddings. In: Font, F., Mesaros, A., Ellis, D.P.W., Fonseca, E., Fuentes, M. and Elizalde, B., (eds.) Proceedings of the 6th Workshop on Detection and Classication of Acoustic Scenes and Events (DCASE 2021). 6th Workshop on Detection and Classification of Acoustic Scenes and Events, DCASE 2021, 15-19 Nov 2021, Virtual conference. DCASE Workshop Proceedings . DCASE , pp. 150-154. ISBN 978-84-09-36072-7
Javed, H.A., Cauchi, B., Doclo, S. et al. (2 more authors) (2017) Measuring, modelling and predicting perceived reverberation. In: Proceedings of 42nd IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP 2017). International Conference on Acoustics, Speech, and Signal Processing (ICASSP), 05-09 Mar 2017, New Orleans, LA, USA. IEEE , pp. 381-385. ISBN 9781509041183