Tomographic imaging and scanning thermal microscopy: thermal impedance tomography

Smallwood, R.H. [r.smallwood@shef.ac.uk], Metherall, P., Hose, D. et al. (6 more authors) (2002) Tomographic imaging and scanning thermal microscopy: thermal impedance tomography. Thermochimica Acta, 385 (1-2). pp. 19-32. ISSN 0040-6031

Abstract

Metadata

Authors/Creators:
  • Smallwood, R.H. [r.smallwood@shef.ac.uk]
  • Metherall, P.
  • Hose, D.
  • Delves, M.
  • Pollock, H.
  • Hammiche, A.
  • Hodges, C.
  • Mathot, V.
  • Willcocks, P.
Copyright, Publisher and Additional Information: Copyright © 2002 Elsevier Science B.V. All rights reserved. For further information, see http://www.dcs.shef.ac.uk/~rod/
Keywords: scanning thermal microscopy; tomographic imaging; sensitivity matrix; polymers
Dates:
  • Published: 25 March 2002
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Rod Smallwood
Date Deposited: 28 Apr 2005
Last Modified: 05 Jun 2014 00:41
Published Version: http://dx.doi.org/10.1016/S0040-6031(01)00705-5
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1016/S0040-6031(01)00705-5

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