Modelling RF interference effects in integrated circuits

Whyman, N. L. and Dawson, J. F. orcid.org/0000-0003-4537-9977 (2001) Modelling RF interference effects in integrated circuits. In: Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on. IEEE , 1203-1208 vol.2.

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Copyright, Publisher and Additional Information: © 2001 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, including reprinting/republishing this material for advertising or promotional purposes, collecting new collected works for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Keywords: analogue integrated circuits,frequency response,integrated circuit modelling,radiofrequency interference,transfer functions,RFI,analogue systems,complex electronic systems,continuous wave irradiation,disturbance effects,high power microwave irradiation,integrated circuits RF interference effects modelling,linear integrated circuits,out-of-band signal conversion,pulse irradiation,upset mechanism determination,Analog integrated circuits,Electromagnetic interference,Frequency conversion,Integrated circuit measurements,Integrated circuit modeling,Power system modeling,Predictive models,Radiofrequency integrated circuits,Radiofrequency interference
Dates:
  • Published: 2001
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 07 Jul 2016 14:27
Last Modified: 14 Nov 2019 08:17
Published Version: https://doi.org/10.1109/ISEMC.2001.950603
Status: Published
Publisher: IEEE
Refereed: No
Identification Number: https://doi.org/10.1109/ISEMC.2001.950603

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