White Rose University Consortium logo
University of Leeds logo University of Sheffield logo York University logo

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

Bradley, D.W. and Tyrrell, A.M. (2002) Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation. IEEE Transactions on Evolutionary Computation. pp. 227-238. ISSN 1089-778X

Full text available as:
[img]
Preview
Text (tyrrellam1.pdf)
tyrrellam1.pdf

Download (397Kb)

Abstract

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real time

Item Type: Article
Copyright, Publisher and Additional Information: Copyright © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: artificial immune system, error detection, fault tolerance, finite-state machine, immunotronics
Academic Units: The University of York > Electronics (York)
Depositing User: Repository Officer
Date Deposited: 02 Feb 2006
Last Modified: 17 Oct 2013 14:32
Published Version: http://dx.doi.org/10.1109/TEVC.2002.1011538
Status: Published
Refereed: Yes
Related URLs:
URI: http://eprints.whiterose.ac.uk/id/eprint/970

Actions (repository staff only: login required)