Self-consistent absorption correction for quantitative energy-dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy

Walther, T. orcid.org/0000-0003-3571-6263 and Wang, X. (2015) Self-consistent absorption correction for quantitative energy-dispersive X-ray spectroscopy of InGaN layers in analytical transmission electron microscopy. In: MacLaren, I., (ed.) Journal of Physics: Conference Series. Electron Microscopy and Analysis Group Conference (EMAG2015), 29 Jun - 03 Jul 2015, Manchester. IOP Publishing: Conference Series , Bristol .

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Copyright, Publisher and Additional Information: Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence (https://creativecommons.org/licenses/by/3.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Dates:
  • Published: 12 October 2015
  • Accepted: 9 September 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 19 Sep 2016 12:57
Last Modified: 19 Sep 2016 12:57
Published Version: http://dx.doi.org/10.1088/1742-6596/644/1/012006
Status: Published
Publisher: IOP Publishing: Conference Series
Refereed: Yes
Identification Number: https://doi.org/10.1088/1742-6596/644/1/012006

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