Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures

Wang, X., Chauvat, M.P., Ruterana, P. et al. (1 more author) (2015) Combination of electron energy-loss spectroscopy and energy dispersive x-ray spectroscopy to determine indium concentration in InGaN thin film structures. Semiconductor Science and Technology, 30 (11). 114011. ISSN 0268-1242

Abstract

Metadata

Authors/Creators:
  • Wang, X.
  • Chauvat, M.P.
  • Ruterana, P.
  • Walther, T.
Copyright, Publisher and Additional Information: © 2015 IOP Publishing Ltd. This is an author produced version of a paper subsequently published in Semiconductor Science and Technology. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Published: 15 October 2015
  • Accepted: 9 June 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 14 Dec 2015 16:39
Last Modified: 27 Oct 2016 12:51
Published Version: http://dx.doi.org/10.1088/0268-1242/30/11/114011
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/0268-1242/30/11/114011

Share / Export

Statistics