Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope

Walther, T. and Wang, X. (2015) Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope. Journal of Microscopy. ISSN 1365-2818

Metadata

Authors/Creators:
  • Walther, T.
  • Wang, X.
Copyright, Publisher and Additional Information: © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Absorption correction; analytical TEM; InGaN; X-ray spectroscopy
Dates:
  • Published: 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 28 Jan 2016 14:25
Last Modified: 16 Nov 2016 13:38
Published Version: https://dx.doi.org/10.1111/jmi.12291
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.12291

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