Measurement and characterisation technique for real-time die temperature prediction of MOSFET-based power electronics

Davidson, J., Stone, D., Foster, M. et al. (1 more author) (2015) Measurement and characterisation technique for real-time die temperature prediction of MOSFET-based power electronics. IEEE Transactions on Power Electronics. ISSN 1941-0107

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Authors/Creators:
  • Davidson, J.
  • Stone, D.
  • Foster, M.
  • Gladwin, D.
Copyright, Publisher and Additional Information: © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Dates:
  • Published: September 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 23 Sep 2015 15:12
Last Modified: 21 Mar 2018 14:54
Published Version: http://dx.doi.org/10.1109/TPEL.2015.2476557
Status: Published
Publisher: IEEE
Refereed: Yes
Identification Number: https://doi.org/10.1109/TPEL.2015.2476557

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