Modelling of transmission and reflection of thin layers for EMC applications in TLM

Dawson, J F orcid.org/0000-0003-4537-9977, Cole, J A and Porter, S J (1997) Modelling of transmission and reflection of thin layers for EMC applications in TLM. In: INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC COMPATIBILITY. INST ELECTRICAL ENGINEERS INSPEC INC , COVENTRY , pp. 65-70.

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Authors/Creators:
Dates:
  • Published: 1997
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 01 Jul 2016 08:44
Last Modified: 14 Nov 2019 08:07
Published Version: https://doi.org/10.1049/cp:19971120
Status: Published
Publisher: INST ELECTRICAL ENGINEERS INSPEC INC
Refereed: Yes
Identification Number: https://doi.org/10.1049/cp:19971120
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