Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

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Walther, T. (2015) Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy. Physica Status Solidi (c), 12 (3). 310 - 313. ISSN 1862-6351

Abstract

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Authors/Creators:
  • Walther, T.
Copyright, Publisher and Additional Information: © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is an author produced version of a paper subsequently published in physica status solidi (c). Uploaded in accordance with the publisher's self-archiving policy. This is the peer reviewed version of the following article: Walther, T., 'Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy', which has been published in final form at https://doi.org/10.1002/pssc.201400121. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving (http://olabout.wiley.com/WileyCDA/Section/id-820227.html).
Keywords: analytical electron microscopy; (scanning) transmission electron microscopy; segregation; X-ray mapping
Dates:
  • Published: 23 January 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 09 Oct 2015 12:57
Last Modified: 16 Nov 2016 10:25
Published Version: https://doi.org/10.1002/pssc.201400121
Status: Published
Publisher: Wiley-VCH Verlag
Refereed: Yes
Identification Number: https://doi.org/10.1002/pssc.201400121

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