How to best measure atomic sergregation to grain boundaries by analytical transmission electron microscopy

Walther, T., Hopkinson, M., Daneu, N. et al. (4 more authors) (2013) How to best measure atomic sergregation to grain boundaries by analytical transmission electron microscopy. Journal of Materials Science, 49 (11). pp. 3898-3908. ISSN 0022-2461

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Authors/Creators:
  • Walther, T.
  • Hopkinson, M.
  • Daneu, N.
  • Recnik, A.
  • Ohno, Y.
  • Inoue, K.
  • Yonenaga, I.
Copyright, Publisher and Additional Information: © 2013 Springer US. This is an author produced version of a paper subsequently published in Journal of Materials Science. Uploaded in accordance with the publisher's self-archiving policy. The final publication is available at Springer via http://dx.doi.org/10.​1007/​s10853-013-7932-2
Dates:
  • Published: 18 December 2013
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 08 Oct 2015 16:24
Last Modified: 16 Nov 2016 09:41
Published Version: https://doi.org/10.​1007/​s10853-013-7932-2
Status: Published
Publisher: Springer-Verlag
Refereed: Yes
Identification Number: https://doi.org/10.​1007/​s10853-013-7932-2

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