Medium-energy ion scattering investigation of the surface and subsurface structure of three-dimensional HoSi2x grown on Si(111)

Wood, T.J., Bonet, C., Noakes, T.C.Q., Bailey, P. and Tear, S.P. (2006) Medium-energy ion scattering investigation of the surface and subsurface structure of three-dimensional HoSi2x grown on Si(111). Physical Review B, 73 (23). pp. 235405-1. ISSN 1550-235X

Abstract

Metadata

Authors/Creators:
  • Wood, T.J.
  • Bonet, C.
  • Noakes, T.C.Q.
  • Bailey, P.
  • Tear, S.P. (spt1@york.ac.uk)
Institution: The University of York
Academic Units: The University of York > Physics (York)
Depositing User: York RAE Import
Date Deposited: 10 Feb 2009 11:08
Last Modified: 10 Feb 2009 11:08
Published Version: http://dx.doi.org/10.1103/PhysRevB.73.235405
Status: Published
Publisher: The American Physical Society.
Identification Number: 10.1103/PhysRevB.73.235405

Share / Export

Statistics