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Application of X-ray photoelectron Sspectroscopy in determining the structure of solid-phase bound substrates

Whitehead, D.M., Jackson, T., McKeown, S.C., Wilson, K. and Routledge, A. (2002) Application of X-ray photoelectron Sspectroscopy in determining the structure of solid-phase bound substrates. Journal Of Combinatorial Chemistry, 4 (4). pp. 255-257. ISSN 1520-4766

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Abstract

The synthesis of compounds on solid supports has grown rapidly in the past 10 years, but one of the hurdles to the routine adoption of solid-supported chemistry is the limited number of analytical methods available to characterize resin-bound compounds. There have been methods developed for on-bead reaction monitoring of solid-phase reactions; both magic angle spinning (MAS) NMR1 and FTIR2 are useful techniques, but much solid-phase chemistry still relies on releasing the product from the solid support for validation. As a result, there still remains the need for complementary techniques that could quantify and/or identify functional groups prepared during solid-phase synthesis.

Item Type: Article
Academic Units: The University of York > Chemistry (York)
Depositing User: York RAE Import
Date Deposited: 23 Apr 2009 13:31
Last Modified: 23 Apr 2009 13:31
Published Version: http://dx.doi.org/10.1021/cc020002a
Status: Published
Publisher: American Chemical Society
Identification Number: 10.1021/cc020002a
URI: http://eprints.whiterose.ac.uk/id/eprint/6570

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