Very-low-energy electron microscopy of doped semiconductors

El-Gomati, M.M. and Wells, T.C.R. (2001) Very-low-energy electron microscopy of doped semiconductors. Applied Physics Letters, 79 (18). 2931-2933.. ISSN 0003-6951

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Authors/Creators:
  • El-Gomati, M.M.
  • Wells, T.C.R.
Institution: The University of York
Depositing User: York RAE Import
Date Deposited: 13 Aug 2009 14:52
Last Modified: 13 Aug 2009 14:52
Published Version: http://dx.doi.org/10.1063/1.1415045
Status: Published
Publisher: American Institute of Physics
Identification Number: https://doi.org/10.1063/1.1415045

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