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Versatile spectral imaging with an algorithm-based spectrometer using highly tuneable quantum dot infrared photodetectors

Vines, P., Tan, C.H., David, J.P.R., Attaluri, R.S., Vandervelde, T.E., Krishna, S., Jang, W.Y. and Hayat, M.M. (2011) Versatile spectral imaging with an algorithm-based spectrometer using highly tuneable quantum dot infrared photodetectors. IEEE Journal of Quantum Electronics, 47 (2). pp. 190-197. ISSN 0018-9197

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Abstract

We report on the implementation of an algorithm-based spectrometer capable of reconstructing the spectral shape of materials in the mid-wave infrared (MWIR) and long-wave infrared (LWIR) wavelengths using only experimental photocurrent measurements from quantum dot infrared photodetectors (QDIPs). The theory and implementation of the algorithm will be described, followed by an investigation into this algorithmic spectrometer's performance. Compared to the QDIPs utilized in an earlier implementation, the ones used here have highly varying spectral shapes and four spectral peaks across the MWIR and LWIR wavelengths. It has been found that the spectrometer is capable of reconstructing broad spectral features of a range of bandpass infrared filters between wavelengths of 4 and 12 mu m as well as identifying absorption features as narrow as 0.3 mu m in the IR spectrum of a polyethylene sheet.

Item Type: Article
Copyright, Publisher and Additional Information: © 2011 IEEE-INST. This is an author produced version of a paper subsequently published in IEEE Journal of Quantum Electronics. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Algorithmic spectrometer; hyperspectral imaging; multispectral imaging; quantum dot infrared photodetectors
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Miss Anthea Tucker
Date Deposited: 25 Feb 2011 13:52
Last Modified: 08 Feb 2013 17:31
Published Version: http://dx.doi.org/10.1109/JQE.2010.2065216
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
Refereed: Yes
Identification Number: 10.1109/JQE.2010.2065216
URI: http://eprints.whiterose.ac.uk/id/eprint/42884

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