All-electronic phase-resolved THz microscopy using the self-mixing effect in a semiconductor laser

Rubino, P, Keeley, J, Sulollari, N et al. (9 more authors) (2021) All-electronic phase-resolved THz microscopy using the self-mixing effect in a semiconductor laser. ACS Photonics, 8 (4). pp. 1001-1006. ISSN 2330-4022

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2021 American Chemical Society. This is an author produced version of a jornal article published in ACS Photonics. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: terahertz; scattering-type scanning near-field microscopy; coherent imaging; quantum cascade lasers; self-mixing
Dates:
  • Accepted: 18 March 2021
  • Published (online): 26 March 2021
  • Published: 21 April 2021
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemistry (Leeds) > Physical Chemistry (Leeds)
The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
FunderGrant number
EPSRC (Engineering and Physical Sciences Research Council)EP/P021859/1
MRC (Medical Research Council)MR/S015833/1
Depositing User: Symplectic Publications
Date Deposited: 19 Mar 2021 12:05
Last Modified: 26 Mar 2022 01:38
Status: Published
Publisher: American Chemical Society
Identification Number: https://doi.org/10.1021/acsphotonics.0c01908
Related URLs:

Export

Statistics