3-D scaling rules for high voltage planar clustered IGBTs

Luo, P. and Madathil, S.N.E. orcid.org/0000-0001-6832-1300 (2020) 3-D scaling rules for high voltage planar clustered IGBTs. IEEE Transactions on Electron Devices, 67 (12). pp. 5613-5620. ISSN 0018-9383

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Keywords: IGBT; Clustered IGBT; scaling rule; safe operating area; short circuit capability; performance limit
Dates:
  • Accepted: 13 October 2020
  • Published (online): 29 October 2020
  • Published: December 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Funding Information:
FunderGrant number
Engineering and Physical Science Research CouncilN/A
Depositing User: Symplectic Sheffield
Date Deposited: 19 Oct 2020 10:39
Last Modified: 08 Feb 2022 13:07
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
Refereed: Yes
Identification Number: https://doi.org/10.1109/TED.2020.3031552

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