Impact of CSI Uncertainty on the MCIK-OFDM Performance: Tight, Closed-Form Symbol Error Probability Analysis

Luong, Thien Van and Ko, Youngwook (2018) Impact of CSI Uncertainty on the MCIK-OFDM Performance: Tight, Closed-Form Symbol Error Probability Analysis. IEEE Transactions on Vehicular Technology. pp. 1272-1279. ISSN 0018-9545

Abstract

Metadata

Item Type: Article
Authors/Creators:
  • Luong, Thien Van
  • Ko, Youngwook (youngwook.ko@york.ac.uk)
Dates:
  • Accepted: 9 September 2017
  • Published: February 2018
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 08 Oct 2019 09:40
Last Modified: 21 Mar 2024 00:18
Published Version: https://doi.org/10.1109/TVT.2017.2753402
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1109/TVT.2017.2753402

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