Experimental verification of electrostatic boundary conditions in gate-patterned quantum devices

Hou, H., Chung, Y., Rughoobur, G. et al. (7 more authors) (2018) Experimental verification of electrostatic boundary conditions in gate-patterned quantum devices. Journal of Physics D: Applied Physics, 51 (24). 244004. ISSN 0022-3727

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Copyright, Publisher and Additional Information: © 2018 IOP Publishing Ltd. This is an author produced version of a paper subsequently published in Journal of Physics D: Applied Physics. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: boundary condition; surface acoustic wave; patterned quantum device
Dates:
  • Accepted: 9 May 2018
  • Published (online): 9 May 2018
  • Published: 20 June 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 24 Oct 2018 13:29
Last Modified: 24 May 2019 00:43
Published Version: https://doi.org/10.1088/1361-6463/aac376
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6463/aac376
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