Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress

Dimech, Evan and Dawson, John Frederick orcid.org/0000-0003-4537-9977 (2018) Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress. In: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society. IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, 21-23 Oct 2018 , pp. 5924-5929.

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Authors/Creators:
Copyright, Publisher and Additional Information: Accepted 18 July 2018
Keywords: Fault detection, diagnostics and prognostics,insulated gate bipolar transistors, accelerated ageing, electrical parameters characterization
Dates:
  • Accepted: 21 October 2018
  • Published: 21 October 2018
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 07 Sep 2018 14:20
Last Modified: 16 Jul 2019 00:07
Published Version: https://doi.org/10.1109/IECON.2018.8591088
Status: Published
Refereed: No
Identification Number: https://doi.org/10.1109/IECON.2018.8591088

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Description: IEEE IECON 2018 - Evan Dimech John Dawson Postprint

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