Aberration Corrected Transmission Electron Microscopy

Walther, T. orcid.org/0000-0003-3571-6263, Dunin-Borkowski, R.E., Rouviere, J.-L. et al. (1 more author) (2017) Aberration Corrected Transmission Electron Microscopy. Journal Of Materials Research, 32 (5). p. 911. ISSN 0884-2914

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Copyright, Publisher and Additional Information: © Materials Research Society 2017. This article has been published in a revised form in Journal of Materials Research https://doi.org/10.1557/jmr.2017.74. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works.
Dates:
  • Published (online): 14 March 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 11 Apr 2018 10:59
Last Modified: 13 Apr 2018 13:41
Published Version: https://doi.org/10.1557/jmr.2017.74
Status: Published
Publisher: Materials Research Society
Refereed: Yes
Identification Number: https://doi.org/10.1557/jmr.2017.74
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