Modelling the threshold voltage for p-channel E-mode GaN HFETs

Kumar, A. orcid.org/0000-0002-8288-6401 and De Souza, M.M. (2018) Modelling the threshold voltage for p-channel E-mode GaN HFETs. IET Power Electronics, 11 (4). ISSN 1755-4535

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Authors/Creators:
Copyright, Publisher and Additional Information: © Institution of Engineering and Technology. This is an author produced version of a paper subsequently published in IET Power Electronics. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: gallium compounds; III-V semiconductors; wide band gap semiconductors; aluminium compounds; MOSFET; two-dimensional hole gas; technology CAD (electronics); threshold voltage modelling; p-channel enhancement-mode heterostructure field-effect transistor; p-channel metal-oxide-semiconductor heterostructure field-effect transistor; polarisation induced two-dimensional hole gas; depletion mode; TCAD simulation; AlGaN-GaN-AlGaN-GaN
Dates:
  • Accepted: 30 October 2017
  • Published (online): 1 April 2018
  • Published: April 2018
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 27 Nov 2017 15:11
Last Modified: 14 Dec 2023 12:43
Status: Published
Publisher: Institution of Engineering and Technology
Refereed: Yes
Identification Number: https://doi.org/10.1049/iet-pel.2017.0438

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