Evaluation of a VNA-based Material Characterization Kit at Frequencies from 0.75 THz to 1.1 THz

Khalid, A, Cumming, D, Clarke, R et al. (2 more authors) (2016) Evaluation of a VNA-based Material Characterization Kit at Frequencies from 0.75 THz to 1.1 THz. In: Yu, J and Chen, X, (eds.) Proceedings of the 2016 IEEE 9th UK-Europe-China Workshop on Millimeter Waves and THz Technologies. IEEE UCMMT 2016, 05-07 Sep 2016, Qingdao, China. IEEE , pp. 38-41. ISBN 978-1-5090-2276-2

Abstract

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Authors/Creators:
  • Khalid, A
  • Cumming, D
  • Clarke, R
  • Chong, L
  • Ridler, N
Copyright, Publisher and Additional Information: © 2016 IEEE. This is an author produced version of a paper published in Proceedings of the 2016 IEEE 9th UK-Europe-China Workshop on Millimeter Waves and THz Technologies. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Calibration, Permittivity measurement, Frequency measurement, Standards, Extraterrestrial measurements, Permittivity, Waveguide transitions
Dates:
  • Accepted: 6 July 2016
  • Published (online): 9 March 2017
  • Published: 5 September 2016
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 21 Mar 2017 10:43
Last Modified: 21 Mar 2017 10:43
Published Version: https://doi.org/10.1109/UCMMT.2016.7873952
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/UCMMT.2016.7873952

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