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Test generation from P systems using model checking

Ipate, F., Gheorghe, M. and Lefticaru, R. (2010) Test generation from P systems using model checking. The Journal of Logic and Algebraic Programming, 79 (6). pp. 350-362. ISSN 1567-8326

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Abstract

This paper presents some testing approaches based on model checking and using different testing criteria. First, test sets are built from different Kripke structure representations. Second, various rule coverage criteria for transitional, non-deterministic, cell-like P systems, are considered in order to generate adequate test sets. Rule based coverage criteria (simple rule coverage, context-dependent rule coverage and variants) are defined and, for each criterion, a set of LTL (Linear Temporal Logic) formulas is provided. A codification of a P system as a Kripke structure and the sets of LTL properties are used in test generation: for each criterion, test cases are obtained from the counterexamples of the associated LTL formulas, which are automatically generated from the Kripke structure codification of the P system. The method is illustrated with an implementation using a specific model checker, NuSMV. (C) 2010 Elsevier Inc. All rights reserved.

Item Type: Article
Copyright, Publisher and Additional Information: © 2010 Elsevier. This is an author produced version of a paper subsequently published in The Journal of Logic and Algebraic Programming. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: P systems; Kripke structures; Model checking; Test generation
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Miss Anthea Tucker
Date Deposited: 10 Sep 2010 14:45
Last Modified: 08 Feb 2013 17:01
Published Version: http://dx.doi.org/10.1016/j.jlap.2010.03.007
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: 10.1016/j.jlap.2010.03.007
URI: http://eprints.whiterose.ac.uk/id/eprint/11214

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