Imaging of interlayer coupling in van der Waals heterostructures using a bright-field optical microscope

Alexeev, E.M. orcid.org/0000-0002-8149-6364, Catanzaro, A., Skrypka, O.V. et al. (8 more authors) (2017) Imaging of interlayer coupling in van der Waals heterostructures using a bright-field optical microscope. Nano Letters, 17 (9). pp. 5342-5349. ISSN 1530-6984

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Copyright, Publisher and Additional Information: This document is the Accepted Manuscript version of a Published Work that appeared in final form in Nano Letters, © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acs.nanolett.7b01763.
Keywords: 2D materials; annealing; interlayer coupling; optical imaging; transition metal dichalcogenides; van der Waals heterostructures
Dates:
  • Published (online): 28 July 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 09 Mar 2017 16:19
Last Modified: 29 Sep 2017 09:52
Published Version: https://doi.org/10.1021/acs.nanolett.7b01763
Status: Published
Publisher: American Chemical Society
Refereed: Yes
Identification Number: https://doi.org/10.1021/acs.nanolett.7b01763
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