Structural, electrical, and optical characterization of as grown and oxidized zinc nitride thin films

Trapalis, A. orcid.org/0000-0003-4887-7058, Heffernan, J., Farrer, I. et al. (2 more authors) (2016) Structural, electrical, and optical characterization of as grown and oxidized zinc nitride thin films. Journal of Applied Physics, 120. 205102. ISSN 1089-7550

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Copyright, Publisher and Additional Information: © 2016 AIP Publishing. This is an author produced version of a paper subsequently published in Journal of Applied Physics. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Accepted: 10 November 2016
  • Published (online): 28 November 2016
  • Published: 28 November 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 16 Nov 2016 16:56
Last Modified: 18 Jul 2017 17:20
Published Version: https://doi.org/10.1063/1.4968545
Status: Published
Publisher: American Institute of Physics
Refereed: Yes
Identification Number: https://doi.org/10.1063/1.4968545

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