Automated background subtraction technique for electron energy-loss spectroscopy and application to semiconductor heterostructures

Angadi, V. orcid.org/0000-0002-0538-4483, Abhayaratne, C. and Walther, T. orcid.org/0000-0003-3571-6263 (2016) Automated background subtraction technique for electron energy-loss spectroscopy and application to semiconductor heterostructures. Journal of Microscopy, 262 (2). pp. 157-166. ISSN 0022-2720

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2016 Wiley. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Background subtraction; core-loss; EELS quantification; hyperspectral imaging; ionization edge.
Dates:
  • Published: May 2016
  • Accepted: 10 February 2016
  • Published (online): 21 March 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 16 Nov 2016 12:45
Last Modified: 13 Apr 2017 09:37
Published Version: http://dx.doi.org/10.1111/jmi.12397
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.12397

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